Patents
Here’s a list of links to PDFs of the patents on this site. A few of these cases were also filed overseas. We’ve also recently filed a provisional application on the thermal Faraday shield.
I also do a fair amount of expert witness work in patent and trade secret cases. I’m always interested in new work, so send me an email and let’s talk about your application.
Solar Photovoltaics
Quantum Computing
Optical Interconnection
- US08528805: METHOD AND APPARATUS PROVIDING FINE ALIGNMENT OF A STRUCTURE
- US08104668B2: METHOD AND APPARATUS PROVIDING FINE ALIGNMENT OF A STRUCTURE RELATIVE TO A SUPPORT
- US20080310808A1: PHOTONIC WAVEGUIDE STRUCTURE WITH PLANARIZED SIDEWALL CLADDING LAYER
- US20080180340A1: WAVEGUIDE COUPLING DEVICES
- US20080285920A1: COUPLING ELEMENT ALIGNMENT USING WAVEGUIDE FIDUCIALS
- US20090003762A1: CHIP TO CHIP OPTICAL INTERCONNECT
- US07857195B2: METHOD AND APPARATUS PROVIDING FINE ALIGNMENT OF A STRUCTURE RELATIVE TO A SUPPORT
- US07841510: METHOD AND APPARATUS PROVIDING FINE ALIGNMENT OF A STRUCTURE RELATIVE TO A SUPPORT
- US07542643B2: COUPLING ELEMENT ALIGNMENT USING WAVEGUIDE FIDUCIALS
- US07480429: CHIP TO CHIP OPTICAL INTERCONNECT
- US07421160: COUPLING ELEMENT USING WAVEGUIDE FIDUCIALS
- US07412134: APPARATUS AND METHODS FOR REMAKEABLE CONNECTIONS TO OPTICAL WAVEGUIDES
- US07197207: APPARATUS AND METHOD FOR OPTICAL INTERCONNECTION
- US07116865: APPARATUS AND METHODS FOR REMAKEABLE CONNECTIONS TO OPTICAL WAVEGUIDES
- US06983097: MAGNETO-OPTICAL SWITCHING BACKPLANE FOR PROCESSOR INTERCONNECTION
- US06816637: MAGNETO-OPTICAL SWITCHING BACKPLANE FOR PROCESSOR INTERCONNECTION
Footprints: a Network of Distributed Low-Cost Infrared Imagers
- US06614348: SYSTEM AND METHOD FOR MONITORING BEHAVIOR PATTERNS
- US06449382: A METHOD AND SYSTEM FOR RECAPTURING A TRAJECTORY OF AN OBJECT
- US06399946: PYROELECTRIC FILM SENSORS
Ultrasensitive Measurements
- US05134276: NOISE CANCELLING CIRCUITRY FOR OPTICAL SYSTEMS WITH SIGNAL DIVIDING AND COMBINING MEANS
- US06259712: INTERFEROMETER METHOD FOR PROVIDING STABILITY OF A LASER
- US05648268: RADIONUCLIDE EXCHANGE DETECTION OF ULTRA TRACE IONIC IMPURITIES IN WATER
- US05294806: OPTICAL SUBMICRON AEROSOL PARTICLE DETECTOR
- US05204631: SYSTEM AND METHOD FOR AUTOMATIC THRESHOLDING OF SIGNALS IN THE PRESENCE OF GAUSSIAN NOISE
- US05192870: OPTICAL SUBMICRON AEROSOL PARTICLE DETECTOR
- US05133602: PARTICLE PATH DETERMINATION SYSTEM
- US05986759: OPTICAL INTERFEROMETER MEASUREMENT APPARATUS AND METHOD
Instruments for Manufacturing and Process Control
- US06567172: SYSTEM AND MULTIPASS PROBE FOR OPTICAL INTERFERENCE MEASUREMENTS
- US05691540: ASSEMBLY FOR MEASURING A TRENCH DEPTH PARAMETER OF A WORKPIECE
- US05516608: METHOD FOR CONTROLLING A LINE DIMENSION ARISING IN PHOTOLITHOGRAPHIC PROCESSES
- US05432670: GENERATION OF IONIZED AIR FOR SEMICONDUCTOR CHIPS
- US05343290: SURFACE PARTICLE DETECTION USING HETERODYNE INTERFEROMETER
- US05316970: GENERATION OF IONIZED AIR FOR SEMICONDUCTOR CHIPS
- US05116583: SUPPRESSION OF PARTICLE GENERATION IN A MODIFIED CLEAN ROOM CORONA AIR IONIZER
Advanced Scanning Technology
- US06118518: ASSEMBLY COMPRISING A POCKET 3-D SCANNER
- US06057947: ENHANCED RASTER SCANNING ASSEMBLY
- US05908586: METHOD FOR ADDRESSING WAVEFRONT ABERRATIONS IN AN OPTICAL SYSTEM
- US05794023: APPARATUS UTILIZING A VARIABLY DIFFRACTIVE RADIATION ELEMENT
- US05638176: INEXPENSIVE INTERFEROMETRIC EYE TRACKING SYSTEM
Solid-Immersion Microscopy (NA=2.8 to 3.2)
- US05220403: APPARATUS AND A METHOD FOR HIGH NUMERICAL APERTURE MICROSCOPIC EXAMINATION OF MATERIALS
- US05208648: APPARATUS AND A METHOD FOR HIGH NUMERICAL APERTURE MICROSCOPIC EXAMINATION OF MATERIALS
