<?xml version="1.0" encoding="utf-8" standalone="yes"?><rss version="2.0" xmlns:atom="http://www.w3.org/2005/Atom"><channel><title>Pages on ElectroOptical Innovations</title><link>https://electrooptical.net/pages/</link><description>Recent content in Pages on ElectroOptical Innovations</description><generator>Hugo</generator><language>en-US</language><lastBuildDate>Thu, 10 Feb 2022 02:52:32 +0000</lastBuildDate><atom:link href="https://electrooptical.net/pages/index.xml" rel="self" type="application/rss+xml"/><item><title>Contact</title><link>https://electrooptical.net/pages/contact/</link><pubDate>Tue, 02 Feb 2021 22:43:22 +0000</pubDate><guid>https://electrooptical.net/pages/contact/</guid><description/></item><item><title>Lab Equipment List</title><link>https://electrooptical.net/pages/equipment/</link><pubDate>Tue, 10 Dec 2019 21:11:52 +0000</pubDate><guid>https://electrooptical.net/pages/equipment/</guid><description>&lt;p&gt;Here&amp;rsquo;s a partial list of EOI&amp;rsquo;s lab equipment. The list is heavily weighted towards electronic stuff, but we also have a very complete set of high precision optical and optomechanical parts: mounts, translation and rotation stages, lenses, prisms, polarization optics, gratings, filters, modulators, detectors, lasers, and fibres, for a start. This lets us try out new ideas quickly and build test setups to verify them.&lt;/p&gt;
&lt;p&gt;If you&amp;rsquo;re also a fan of classical equipment, you can download manuals at &lt;a href="https://support.keysight.com/s/?language=en_US"&gt;Keysight (formerly Agilent, formerly HP)&lt;/a&gt; and &lt;a href="https://www.tek.com/product-support"&gt;Tektronix&lt;/a&gt;, &lt;a href="http://www.liberatedmanuals.com"&gt;liberatedmanuals.com&lt;/a&gt;, &lt;a href="http://bama.edebris.com/manuals"&gt;BAMA&lt;/a&gt;, &lt;a href="http://www.ko4bb.com/getsimple/index.php?id=manuals"&gt;Kurt&amp;rsquo;s Manuals&lt;/a&gt;, &lt;a href="http://elektrotanya.com"&gt;ElektroTanya.com&lt;/a&gt;, and &lt;a href="http://www.ko4bb.com/manuals/"&gt;K04BB&lt;/a&gt;. KE5FX&amp;rsquo;s &lt;a href="http://www.thegleam.com/ke5fx/gpib/readme.htm"&gt;GPIB Tools&lt;/a&gt; are pretty serviceable and also free.   (NB: Keysight for some reason doesn&amp;rsquo;t allow deep links to their support pages—you have to go through the main page and select &amp;ldquo;support&amp;rdquo;.)&lt;/p&gt;</description></item><item><title>Footprints Project</title><link>https://electrooptical.net/pages/footprints/</link><pubDate>Sat, 24 Feb 2018 22:41:26 +0000</pubDate><guid>https://electrooptical.net/pages/footprints/</guid><description>&lt;a class="gallery-photo" href="https://electrooptical.net/media/uploads/footprints/pizzafil.jpg" aria-label="View full-size photo"&gt;
 &lt;img class="" alt="" src="https://electrooptical.net/media/uploads/footprints/pizzafil.jpg" width="780" height="336" loading="lazy"&gt;
&lt;/a&gt;
&lt;p class="gallery-caption"&gt;
Pizzafil
&lt;/p&gt;
&lt;a class="gallery-photo" href="https://electrooptical.net/media/uploads/footprints/sensor2small.jpg" aria-label="View full-size photo"&gt;
 &lt;img class="" alt="" src="https://electrooptical.net/media/uploads/footprints/sensor2small.jpg" width="1045" height="991" loading="lazy"&gt;
&lt;/a&gt;
&lt;p class="gallery-caption"&gt;
Sensor2small
&lt;/p&gt;
&lt;a class="gallery-photo" href="https://electrooptical.net/media/uploads/footprints/sidestacksmall.jpg" aria-label="View full-size photo"&gt;
 &lt;img class="" alt="" src="https://electrooptical.net/media/uploads/footprints/sidestacksmall_hu_271fdc6571dc36d5.jpg" width="1100" height="573" loading="lazy"&gt;
&lt;/a&gt;
&lt;p class="gallery-caption"&gt;
Sidestacksmall
&lt;/p&gt;
&lt;a class="gallery-photo" href="https://electrooptical.net/media/uploads/footprints/sensorasmall.jpg" aria-label="View full-size photo"&gt;
 &lt;img class="" alt="" src="https://electrooptical.net/media/uploads/footprints/sensorasmall.jpg" width="752" height="746" loading="lazy"&gt;
&lt;/a&gt;
&lt;p class="gallery-caption"&gt;
Sensorasmall
&lt;/p&gt;</description></item><item><title>Lab Tour</title><link>https://electrooptical.net/pages/lab-tour/</link><pubDate>Thu, 02 Nov 2017 11:11:46 +0000</pubDate><guid>https://electrooptical.net/pages/lab-tour/</guid><description>&lt;p&gt;Come on into the EOI lab and we&amp;rsquo;ll show you around!&lt;/p&gt;
&lt;a class="gallery-photo" href="https://electrooptical.net/media/uploads/labPhotos/EOI_OfficeDoor.png" aria-label="View full-size photo"&gt;
 &lt;img class="" alt="" src="https://electrooptical.net/media/uploads/labPhotos/EOI_OfficeDoor_hu_9e132288cca824be.png" width="1100" height="825" loading="lazy"&gt;
&lt;/a&gt;
&lt;p class="gallery-caption"&gt;
We'll start with my office door and pan around to the right.
&lt;/p&gt;
&lt;a class="gallery-photo" href="https://electrooptical.net/media/uploads/labPhotos/EOI_DeskCorner.png" aria-label="View full-size photo"&gt;
 &lt;img class="" alt="" src="https://electrooptical.net/media/uploads/labPhotos/EOI_DeskCorner_hu_5aab6b7a99c89a34.png" width="1100" height="825" loading="lazy"&gt;
&lt;/a&gt;
&lt;p class="gallery-caption"&gt;
Since I do a lot of stuff on B-size vellum, the antique drafting table is appropriate. The print is Botticelli's Madonna del Libro.
&lt;/p&gt;
&lt;a class="gallery-photo" href="https://electrooptical.net/media/uploads/labPhotos/rot_EOI_DrawingTable.png" aria-label="View full-size photo"&gt;
 &lt;img class="" alt="" src="https://electrooptical.net/media/uploads/labPhotos/rot_EOI_DrawingTable_hu_d9b3a8b68a7a90ac.png" width="1100" height="1467" loading="lazy"&gt;
&lt;/a&gt;
&lt;p class="gallery-caption"&gt;
Here I'm in the middle of going over the schematics for an ultrastable cavity-locked laser (Allen variance &lt; 1E-10 @ 100,000 seconds)
&lt;/p&gt;</description></item><item><title>Building Electro-Optical Systems: Making it all Work</title><link>https://electrooptical.net/pages/book/</link><pubDate>Mon, 01 Jan 0001 00:00:00 +0000</pubDate><guid>https://electrooptical.net/pages/book/</guid><description>&lt;div class="book-feature"&gt;
&lt;div class="book-cover"&gt;
&lt;a href="https://www.amazon.com/exec/obidos/asin/1119438977"&gt;
&lt;figure class="doc-figure doc-figure--full"&gt;&lt;img class="doc-figure__img doc-figure__img--screen" src="https://electrooptical.net/eoi/book_hu_697b6f379c8595df.webp" width="400" height="570" loading="lazy" decoding="async" alt="Building Electro-Optical Systems: Making It All Work, 3rd Edition cover"&gt;&lt;img class="doc-figure__img doc-figure__img--print" src="https://electrooptical.net/eoi/book_hu_8df374f3a4860ac.jpg" width="400" height="570" alt="Building Electro-Optical Systems: Making It All Work, 3rd Edition cover"&gt;&lt;/figure&gt;
&lt;/a&gt;
&lt;/div&gt;
&lt;div class="book-descrip"&gt;
&lt;p&gt;This book is an attempt to provide a systematic and accessible presentation of the practical lore of electro-optical instrument design and construction: in other words, it&amp;rsquo;s the book I needed as a graduate student, but couldn&amp;rsquo;t find.&lt;/p&gt;
&lt;p&gt;It&amp;rsquo;s intended in the first instance for use by oppressed graduate students in physics and electrical engineering, who have to get their apparatus working long enough to take some data before they can graduate. When they do, they’ll find that real-world design work has much the same harassed and overextended flavor, so in the second instance, it’s intended as a self-teaching guide and professional reference for working electro-optical designers.&lt;/p&gt;</description></item><item><title>Capability</title><link>https://electrooptical.net/pages/capability/</link><pubDate>Mon, 01 Jan 0001 00:00:00 +0000</pubDate><guid>https://electrooptical.net/pages/capability/</guid><description>&lt;ul&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/pages/equipment/"&gt;Equipment&lt;/a&gt; — a partial list of EOI&amp;rsquo;s lab equipment&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/pages/lab-tour/"&gt;Lab Tour&lt;/a&gt; — photos from around the EOI lab&lt;/li&gt;
&lt;/ul&gt;</description></item><item><title>Consulting</title><link>https://electrooptical.net/pages/consulting/</link><pubDate>Mon, 01 Jan 0001 00:00:00 +0000</pubDate><guid>https://electrooptical.net/pages/consulting/</guid><description>&lt;h2 id="consulting-services"&gt;Consulting Services&lt;/h2&gt;
&lt;p&gt;I got started in consulting during my 20 years as a Research Staff Member at IBM T. J. Watson Research Center. I began in the Manufacturing Research department, building special instruments for unique manufacturing problems for which commercial solutions did not exist, such as scanned-probe and solid-immersion microscopy, and in-chamber particle detection. I also did a fair amount of firefighting, retrofitting semiconductor lithography equipment for new capabilities, and helping fix problems that were causing immediate revenue loss in manufacturing. Later I developed new classes of computer input device, advanced scanning technology, and a new class of photonic detector and switch for optical interconnection, based on metal-insulator-metal tunnel junctions.&lt;/p&gt;</description></item><item><title>Expert Witness Work</title><link>https://electrooptical.net/pages/expert-work/</link><pubDate>Mon, 01 Jan 0001 00:00:00 +0000</pubDate><guid>https://electrooptical.net/pages/expert-work/</guid><description>&lt;p&gt;With more than 30 years&amp;rsquo; experience designing electronic, optical, and mixed-technology systems, and 43 US patents issued or pending, I have amassed a lot of expertise in a number of fields, including optics, optoelectronics, electro-optics, photonics (especially silicon photonics), analog electronics, optomechanics, optical and atomic force microscopy, semiconductor processing, signal processing, simulation, electromagnetics, due diligence, and the drafting and technical interpretation of patents.&lt;/p&gt;
&lt;p&gt;Expert witness work is one natural application, and I&amp;rsquo;ve been testifying expert in &lt;a href="https://electrooptical.net/media/uploads/phcaselistnocontacts.pdf"&gt;35 matters&lt;/a&gt;
to date, including &lt;em&gt;inter partes&lt;/em&gt; reviews and cases in district court and before the International Trade Commission. I&amp;rsquo;m expert in optics, photonics, microscopy, and analog electronics, as well as some areas of semiconductor processing, metrology, and testing. I&amp;rsquo;ve also written about 150,000 lines of C++ code, mostly for electromagnetic simulation, instrument control, and embedded applications, so I do a lot of reverse engineering and source code review as well.&lt;/p&gt;</description></item><item><title>Patents</title><link>https://electrooptical.net/pages/patents/</link><pubDate>Mon, 01 Jan 0001 00:00:00 +0000</pubDate><guid>https://electrooptical.net/pages/patents/</guid><description>&lt;p&gt;Here&amp;rsquo;s a list of links to PDFs of the patents on this site. A few of these cases were also filed overseas. We&amp;rsquo;ve also recently filed a provisional application on the thermal Faraday shield.&lt;/p&gt;
&lt;p&gt;I also do a fair amount of &lt;a href="https://electrooptical.net/pages/expert-work/"&gt;expert witness work&lt;/a&gt; in patent and trade secret cases. I&amp;rsquo;m always interested in new work, so &lt;a href="mailto:pcdhobbs@electrooptical.net?subject=Patents&amp;#43;Page"&gt;send me an email&lt;/a&gt;
and let&amp;rsquo;s talk about your application.&lt;/p&gt;
&lt;h2 id="solar-photovoltaics"&gt;Solar Photovoltaics&lt;/h2&gt;
&lt;ul&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US08569616__.pdf"&gt;US08569616: METHOD OF CONCENTRATING SOLAR ENERGY&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US08026439__.pdf"&gt;US08026439: SOLAR CONCENTRATOR SYSTEM&lt;/a&gt;&lt;/li&gt;
&lt;/ul&gt;
&lt;h2 id="quantum-computing"&gt;Quantum Computing&lt;/h2&gt;
&lt;ul&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US07889992__.pdf"&gt;US07889992: HYBRID SUPERCONDUCTOR OPTICAL QUANTUM REPEATER&lt;/a&gt;&lt;/li&gt;
&lt;/ul&gt;
&lt;h2 id="optical-interconnection"&gt;Optical Interconnection&lt;/h2&gt;
&lt;ul&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US08528805__.pdf"&gt;US08528805: METHOD AND APPARATUS PROVIDING FINE ALIGNMENT OF A STRUCTURE&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US08104668B2__.pdf"&gt;US08104668B2: METHOD AND APPARATUS PROVIDING FINE ALIGNMENT OF A STRUCTURE RELATIVE TO A SUPPORT&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/us28310808a1.pdf"&gt;US20080310808A1: PHOTONIC WAVEGUIDE STRUCTURE WITH PLANARIZED SIDEWALL CLADDING LAYER&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/us28180340a1.pdf"&gt;US20080180340A1: WAVEGUIDE COUPLING DEVICES&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/us28285920a1.pdf"&gt;US20080285920A1: COUPLING ELEMENT ALIGNMENT USING WAVEGUIDE FIDUCIALS&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/us29003762a1.pdf"&gt;US20090003762A1: CHIP TO CHIP OPTICAL INTERCONNECT&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US07857195B2__.pdf"&gt;US07857195B2: METHOD AND APPARATUS PROVIDING FINE ALIGNMENT OF A STRUCTURE RELATIVE TO A SUPPORT&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US07841510__.pdf"&gt;US07841510: METHOD AND APPARATUS PROVIDING FINE ALIGNMENT OF A STRUCTURE RELATIVE TO A SUPPORT&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US07542643__.pdf"&gt;US07542643B2: COUPLING ELEMENT ALIGNMENT USING WAVEGUIDE FIDUCIALS&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US07480429__.pdf"&gt;US07480429: CHIP TO CHIP OPTICAL INTERCONNECT&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US07421160__.pdf"&gt;US07421160: COUPLING ELEMENT USING WAVEGUIDE FIDUCIALS&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US07412134__.pdf"&gt;US07412134: APPARATUS AND METHODS FOR REMAKEABLE CONNECTIONS TO OPTICAL WAVEGUIDES&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US07197207__.pdf"&gt;US07197207: APPARATUS AND METHOD FOR OPTICAL INTERCONNECTION&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US07116865__.pdf"&gt;US07116865: APPARATUS AND METHODS FOR REMAKEABLE CONNECTIONS TO OPTICAL WAVEGUIDES&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US06983097__.pdf"&gt;US06983097: MAGNETO-OPTICAL SWITCHING BACKPLANE FOR PROCESSOR INTERCONNECTION&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US06816637__.pdf"&gt;US06816637: MAGNETO-OPTICAL SWITCHING BACKPLANE FOR PROCESSOR INTERCONNECTION&lt;/a&gt;&lt;/li&gt;
&lt;/ul&gt;
&lt;h2 id="footprints-a-network-of-distributed-low-cost-infrared-imagers"&gt;Footprints: a Network of Distributed Low-Cost Infrared Imagers&lt;/h2&gt;
&lt;ul&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US06614348__.pdf"&gt;US06614348: SYSTEM AND METHOD FOR MONITORING BEHAVIOR PATTERNS&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US06449382__.pdf"&gt;US06449382: A METHOD AND SYSTEM FOR RECAPTURING A TRAJECTORY OF AN OBJECT&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US06399946__.pdf"&gt;US06399946: PYROELECTRIC FILM SENSORS&lt;/a&gt;&lt;/li&gt;
&lt;/ul&gt;
&lt;h2 id="ultrasensitive-measurements"&gt;Ultrasensitive Measurements&lt;/h2&gt;
&lt;ul&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US05134276__.pdf"&gt;US05134276: NOISE CANCELLING CIRCUITRY FOR OPTICAL SYSTEMS WITH SIGNAL DIVIDING AND COMBINING MEANS&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US06259712__.pdf"&gt;US06259712: INTERFEROMETER METHOD FOR PROVIDING STABILITY OF A LASER&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US05648268__.pdf"&gt;US05648268: RADIONUCLIDE EXCHANGE DETECTION OF ULTRA TRACE IONIC IMPURITIES IN WATER&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US05294806__.pdf"&gt;US05294806: OPTICAL SUBMICRON AEROSOL PARTICLE DETECTOR&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US05204631__.pdf"&gt;US05204631: SYSTEM AND METHOD FOR AUTOMATIC THRESHOLDING OF SIGNALS IN THE PRESENCE OF GAUSSIAN NOISE&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US05192870__.pdf"&gt;US05192870: OPTICAL SUBMICRON AEROSOL PARTICLE DETECTOR&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US05133602__.pdf"&gt;US05133602: PARTICLE PATH DETERMINATION SYSTEM&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US05986759__.pdf"&gt;US05986759: OPTICAL INTERFEROMETER MEASUREMENT APPARATUS AND METHOD&lt;/a&gt;&lt;/li&gt;
&lt;/ul&gt;
&lt;h2 id="instruments-for-manufacturing-and-process-control"&gt;Instruments for Manufacturing and Process Control&lt;/h2&gt;
&lt;ul&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US06567172__.pdf"&gt;US06567172: SYSTEM AND MULTIPASS PROBE FOR OPTICAL INTERFERENCE MEASUREMENTS&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US05691540__.pdf"&gt;US05691540: ASSEMBLY FOR MEASURING A TRENCH DEPTH PARAMETER OF A WORKPIECE&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US05516608__.pdf"&gt;US05516608: METHOD FOR CONTROLLING A LINE DIMENSION ARISING IN PHOTOLITHOGRAPHIC PROCESSES&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US05432670__.pdf"&gt;US05432670: GENERATION OF IONIZED AIR FOR SEMICONDUCTOR CHIPS&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US05343290__.pdf"&gt;US05343290: SURFACE PARTICLE DETECTION USING HETERODYNE INTERFEROMETER&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US05316970__.pdf"&gt;US05316970: GENERATION OF IONIZED AIR FOR SEMICONDUCTOR CHIPS&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US05116583__.pdf"&gt;US05116583: SUPPRESSION OF PARTICLE GENERATION IN A MODIFIED CLEAN ROOM CORONA AIR IONIZER&lt;/a&gt;&lt;/li&gt;
&lt;/ul&gt;
&lt;h2 id="advanced-scanning-technology"&gt;Advanced Scanning Technology&lt;/h2&gt;
&lt;ul&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US06118518__.pdf"&gt;US06118518: ASSEMBLY COMPRISING A POCKET 3-D SCANNER&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US06057947__.pdf"&gt;US06057947: ENHANCED RASTER SCANNING ASSEMBLY&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US05908586__.pdf"&gt;US05908586: METHOD FOR ADDRESSING WAVEFRONT ABERRATIONS IN AN OPTICAL SYSTEM&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US05794023__.pdf"&gt;US05794023: APPARATUS UTILIZING A VARIABLY DIFFRACTIVE RADIATION ELEMENT&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US05638176__.pdf"&gt;US05638176: INEXPENSIVE INTERFEROMETRIC EYE TRACKING SYSTEM&lt;/a&gt;&lt;/li&gt;
&lt;/ul&gt;
&lt;h2 id="solid-immersion-microscopy-na28-to-32"&gt;Solid-Immersion Microscopy (NA=2.8 to 3.2)&lt;/h2&gt;
&lt;ul&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US05220403__.pdf"&gt;US05220403: APPARATUS AND A METHOD FOR HIGH NUMERICAL APERTURE MICROSCOPIC EXAMINATION OF MATERIALS&lt;/a&gt;&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US05208648__.pdf"&gt;US05208648: APPARATUS AND A METHOD FOR HIGH NUMERICAL APERTURE MICROSCOPIC EXAMINATION OF MATERIALS&lt;/a&gt;&lt;/li&gt;
&lt;/ul&gt;
&lt;h2 id="scanned-probe-microscopy"&gt;Scanned-Probe Microscopy&lt;/h2&gt;
&lt;ul&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/eoi/patents/US05298975__.pdf"&gt;US05298975: COMBINED SCANNING FORCE MICROSCOPE AND OPTICAL METROLOGY TOOL&lt;/a&gt;&lt;/li&gt;
&lt;/ul&gt;</description></item><item><title>Recent Work</title><link>https://electrooptical.net/pages/recent-work/</link><pubDate>Mon, 01 Jan 0001 00:00:00 +0000</pubDate><guid>https://electrooptical.net/pages/recent-work/</guid><description>&lt;p&gt;EOI works with customers of all sizes, from garage startups and university research groups to the largest companies in the electronics, defense, biomedical, and semiconductor equipment industries. We do research, technology selection, product design, IP licensing, and expert witness work in both patent and trade secret cases. We&amp;rsquo;re always ready to help with debugging and firefighting as well—we learned some of this stuff the hard way too.&lt;/p&gt;
&lt;h2 id="ultrasensitive-instrument-design"&gt;Ultrasensitive Instrument Design&lt;/h2&gt;
&lt;h3 id="complete-designs-and-prototypes"&gt;Complete Designs and Prototypes&lt;/h3&gt;
&lt;article class="item"&gt;
 &lt;h4&gt;&lt;a href="https://electrooptical.net/blog/new-product-la-22-low-noise-lab-amplifier/"&gt;Featured Product: LA-22 Low Noise Lab Amplifier&lt;/a&gt;&lt;/h4&gt;
 &lt;h2 id="the-la-22-low-noise-laboratory-amplifier-800-hz22mhz-11-nv--hz"&gt;The LA-22 Low-Noise Laboratory Amplifier, 800 Hz–22 MHz, 1.1 nV / √Hz&lt;/h2&gt;
&lt;p&gt;One problem that comes up again and again in doing measurements is that we need the apparatus to be quieter than the thing we&amp;rsquo;re measuring, ideally by at least a factor of two.   Besides quiet, it should be wideband, have an accurately known gain that&amp;rsquo;s flat with frequency, have a clean step response, and generally do its job while keeping itself out of the way.  There&amp;rsquo;s a wealth of detail in our &lt;a href="https://electrooptical.net/media/uploads/photoreceiver_testing_system_0_1_2.pdf"&gt;app note AN-1&lt;/a&gt;
 on photoreceiver testing.&lt;/p&gt;</description></item><item><title>Resources</title><link>https://electrooptical.net/pages/resources/</link><pubDate>Mon, 01 Jan 0001 00:00:00 +0000</pubDate><guid>https://electrooptical.net/pages/resources/</guid><description>&lt;ul&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/articles/good-books/"&gt;Good Books&lt;/a&gt; — classic books on electro-optics and circuits, in softcopy&lt;/li&gt;
&lt;li&gt;&lt;a href="https://electrooptical.net/categories/sed/"&gt;sci.electronics.design&lt;/a&gt; — posts from the SED newsgroup archive&lt;/li&gt;
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