September 7, 2017
In cooperation with InView Technology. Compressive scanning is a scheme for doing image sensing with a single-element detector, without suffering the N2 speed penalty of raster scanning. It’s a sort of combination of scanning and image compression—you use a digital micromirror device (DMD) to multiply the image by a series of 1-bit digital basis functions, measure the resulting photocurrent, and then invert the transform to produce a compressed image. That’s not too useful in the visible, where image sensors are cheap commodity items, but in the UV and especially the shortwave IR (SWIR), image arrays are extremely expensive, so there’s a need for compressive scan cameras.
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Discussion on the topic here.
This one came from a a major industrial research laboratory: near shot noise limited detection of 1 nA currents in 100 MHz bandwidth.
This was one that I wasn’t at all sure would work: it’s pretty sporty trying to detect a few dozen electrons at 100 MHz in a built-up circuit. (A 100-MHz lowpass has a time-domain response about 5 ns wide, and 1 nA in 5 ns is 31 electrons.) Obviously to get the highest available signal voltage, the input-node capacitance has to be absolutely the minimum possible: less than 1 pF.
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60 dB of laser RIN cancellation out to > 10 MHz, about 100 times faster than current commercial devices
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Using POEMS to design waveguides, coupling structures, and optical/chemical interaction regions; consulting on microfabrication issues
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This is for for a scanning surface potential measurement tool, used in contamination detection in semiconductors: 40 attocoulomb sensitivity in a 4 MHz bandwidth
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